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ASPURE Nitrile Gloves II (Pure Pack) High Grip Type (Fully Embossed) L 1000 pieces 1 box (100 pieces x 10 bags)
ASPURE Nitrile Gloves II (Pure Pack) High Grip Type (Fully Embossed) L 1000 pieces 1 box (100 pieces x 10 bags)
Anti-static gloves
Anti-static products
ASPURE Nitrile Gloves II Pure Pack Full Embossed High Grip (For clean rooms)
Azpure 2023>2024
Catalog Publication Special
Class 100 to 1000
Clean and anti-static
Clean environment/anti-static products
Clean gloves
Clean gloves (class 100-1000)
Clean gloves (for the semiconductor industry)
Cleanware Selections (Class 100 to 1000 Environments)
Disposable gloves (nitrile rubber and other synthetic rubber)
Featured
For the Semiconductor Industry
gloves
Gloves and finger cots
Nitrile gloves (clean washed)
Nitrile Gloves Ⅱ
Research Equipment
Safety Equipment
Special feature on manufacturing industry products
Thin, disposable gloves
Regular price
¥58,410
Regular price
Sale price
¥58,410
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These nitrile rubber gloves have excellent durability, antistatic properties, and static electricity diffusion properties.
These gloves are made of synthetic rubber and are less susceptible to contamination. Material: NBR (nitrile rubber)
Powder Free
Surface resistivity: 10^11Ω/□ or less
Total length: approx. 300mm (12 inches)
Thickness: Approx. 0.14mm (palm)
Double Chlorination
For both left and right use
Double-wrapped for clean rooms
Size: L
Pure Pack (pure water cleaning, residual ion and particle management products)
Class 100 compatible
Quantity: 1 box (100 sheets/bag x 10 bags)
High grip type (full embossed)
[Ion Data] (These are standard values based on the IEST measurement method. They are not guaranteed values.)
Residual Particles
In liquid (0.5-20μm): <1200
Residual substances
Silicon: Not detected
Amide: Not detected
Phthalates: Not detected
Residual ions (μg/cm2)
F-: <0.002
Cl-: <0.2
Br-: <0.005
NO3-: <0.25
PO43- (phosphate ion): <0.01
SO42- (sulfate ion): <0.05
Li+: <0.002
Na+: <0.03
NH4+: <0.01
K+: <0.01
Mg2+: <0.01
Ca2+: <0.15
[Particle data (high grip type fingertip embossing)]
Inspection location: Wakayama CIC
Measurement method: JIS B9923 tumbling method
Sample: 1-4773-53
Measurement data: Total value of 10 randomly selected specimens (average of 3 runs)
Particle size (μm)/number of particles
0.3 to less than 0.5/12
0.5 to less than 1.0/3
1.0 to less than 2.0/1
2.0 to less than 5.0/0
5.0 or higher/0
*Measured values (not guaranteed values).
RoHS2 (EU)2015/863 compliant [About RoHS]
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